EON-SII：用于致密星天体物理学的可移动皮秒级恒星强度干涉仪设计

本文介绍了EON-SII的设计与性能，这是一种旨在将强度干涉测量技术扩展至更暗天体目标的可移动双望远镜系统。该系统通过优化光学设计与频谱仪配置，能够对星等在V=8.5至V=10.7范围内的致密星进行观测。

arXiv:2608.17444v1 Announce Type: new Abstract: Stellar intensity interferometry (SII) measures correlations in photon-arrival fluctuations recorded by telescopes observing bright celestial sources. It can resolve angular scales far smaller than those accessible to a single optical telescope and is largely insensitive to atmospheric turbulence. After the first demonstration of SII on Sirius in 1956, Hanbury Brown and Twiss used the technique to measure the diameters of 32 stars. More recently, VERITAS, MAGIC, H.E.S.S., and CTAO's LST-1 have revived the method, although observations remain restricted to bright targets because of their optical design, optimized for gamma-ray astrophysics, rather than SII. We present EON-SII, the design and performance of a two-telescope intensity interferometer intended to extend the SII technique to compact targets at magnitudes of about V=8.5 up to V=10.7. Each transportable telescope has a 4-m diameter mirror, approximately 9m2 collecting area, an actively aligned 18-panel primary mirror, and Cassegrain optics specified to concentrate at least 90% of the light within 3 arcsec. A fibre-free spectrograph covers 400-550 nm at R~7000-8000 and is designed to provide of order 1000 statistically independent spectral channels.